[Yameng CaoParticipant]

Thanks Damian, That’s the shape i’m gunning for! But is there a way to rotate by 90 degrees so its symmetry axis is along y?

[Yameng CaoParticipant]

I understand this now, thank you!

[Yameng CaoParticipant]

Thanks Damian, the issue has been resolved

[Yameng CaoParticipant]

Hi Damian,

Ok, so it is not possible to visualize the sources and observation points but I tried to use a 3D sphere object with small diameter to set the position of the source and detectors in the sample. I want to place the source in the middle of the rod’s height, measure the field there, above it, outside the cavity and below in the substrate. So I fixed the observation planes and added a few more. Here is the project file again.

When you mention “they are half a micron away from the simulation boundary”, how do I check the simulation boundary? As far as I can see, I have number of Y cells as 300 and 0.02microns big, that’s 6 microns vertically, so all except the topmost detector should be included, please correct me if needed.

Thank you!
Yameng

[Yameng CaoParticipant]

Hi Damian,
I had been doing a 3D simulation, mesh size 0.4 for x and z, 0.5 for y. I am re-running those simulations, at 0.2um x z and 0.25um y. Keeping everything else the same.

The 2d ref index doesn’t make sense as my structure is in three dimensions. So, you can look at the sliced 3D refractive index, which is correct as I checked it.

From your image I see that the source and the observation points are displayed as spheres in the 3D layout, how do I enable viewing the input source and observation points in the 32bit program?

Thank you!
Yameng

[Yameng CaoParticipant]

Thank you, though I do not understand why you take this convention, why not call electrical field components Ex, Ey and Ez and magnetic with Hx Hy and Hz? Do you know where in that book is the convention explained?

Yameng

[Yameng CaoParticipant]

Damian thanks for your reply, I have attached my project files.

Here’s some info about my structure:
wafer dimension: x=5um, z=5um

Top layer: rods, n-3.5, H1 defect in triangle lattice
substrate: n=3.5
source: 0.6um, Gaussian CW,
observation points in cavity and around
observation areas for all three planes