transmission measurement vs simulation
We have measured both specular transmittance and total transmittance (with an integrating sphere). The source is not polarized. I am looking into three different methods: TMM, Layered KKR and FDTD. It seems TMM and LKKR can simulate the specular transmittance and reflectance, but FDTD is simulating total transmittance with a detector plane. Is that right?
What would be the best measurement method for transmittance/reflectance/diffraction that can fully reflect the simulation?
BTW, I am simulating a multilayer colloidal photonic crystal structure.
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